Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing

Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing

$18,336.24
Place of Origin
China
Shipping
Air Freight, Ocean Freight, Land Freight

Product Description

Overview

brand
Haoji Keji
purpose
Chip/Semiconductor Testing
temperature range
-70 ℃~180 ℃
Processing customization
yes
Operation mode
Temperature control method
PDI
Temperature drop rate
155.0 ℃~-55.0 ℃
Temperature rise rate
-55.0 ℃~155.0 ℃
Humidity control range
20.0% RH~98.0% RH
Internal material
1.2mm thick stainless steel plate
External material
2.0mm thick cold-rolled steel plate
Thermal insulation materials
100mm thick polyurethane board
Fan
Centrifugal fan
compressor
Bizel compressor, Germany
source
380V AC 50/60Hz
controller
touch screen

Product Details

Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing
Fast Temperature Change Test Box Haoji Temperature Change Experiment Linear Nonlinear Chip Semiconductor Testing

Trading Area

Global

Quotation

Name
Company
Phone
Email Address
Requirements
Quotation
Haoji Technology (Guangdong) Co., Ltd
, China
Chat
  • Contact
  • chuhaiyi@baidu.com
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