Overview
| brand | Dihedron | Does it support processing customization | yes |
| Imported or not | no | Wavelength range | |
| material | material quality | ||
| Sampling flow range | Operation mode | ||
| Metering method | Measurement object | ||
| measuring range | measurement accuracy | ||
| Measuring caliber | 300-800mm | Measurement time | |
| Measurement repeatability | Test scope | ||
| size | Pupillary distance | ||
| Exit pupil diameter | source | ||
| reflectivity | Magnification rate | ||
| Magnification factor | Magnification rate | ||
| resolving power | Graduation value | ||
| Analysis time | Lattice value | ||
| working voltage | working temperature | ||
| power | Photometric range | ||
| Smoothness | light source | ||
| specifications | thickness | ||
| ambient temperature | Detection distance | ||
| Testing items | focal length | ||
| structure | Resolution | ||
| Dielectric strength | accuracy | ||
| Precision | accuracy | ||
| Scale circle diameter | type | ||
| Continuous working hours | Range range | ||
| Filter specifications | variety | ||
| Sampling rate | Sampling time | ||
| Incidence angle | Scanning range | ||
| Scanning method | Lifting range | ||
| Whether equipped with cross hairs | Indication error | ||
| field | visual field | ||
| Applicable scope | Probe type | ||
| Projection method | Transmittance | ||
| Temperature compensation range | Objective diameter | ||
| Display Range | Display method | ||
| response time | model | ||
| serial number | colour | ||
| Effective sight distance | Effective pixels | ||
| Effective diameter | noise | ||
| length | type | ||
| weight | Number of boxes packed | ||
| Accuracy | UV wavelength | ||
| UV power | Closest working distance | ||
| Applicable industries | optics | purpose | Widely used for high-precision detection of planar optical components. |
| Measurement method | Fischer interference principle | Phase shifting method | 300nm, 600nm, 800nm |
| Host wavelength | 600nm, 632.8nm | Host phase resolution | 2048 * 2048 |
| Main camera focusing ability | have | Main camera acquisition speed | 50Hz |
| Surface shape error of transmission plane reference mirror | λ/ ten | Reflection plane reference mirror surface shape error | ≤ λ/ 10 (customizable |
| Cavity accuracy | ≤ λ/ 10, λ= 632.8nm | Measuring the transmission and reflection wavefront of high parallelism optical elements | support |
| Standard accessories | Computer, stripe monitoring and analysis software | Operating temperature requirements | 22 ℃± 1 ℃ |
Product Details
The laser interferometer uses phase shift technology to accurately characterize the three-dimensional morphology of the measured surface, with a measurement accuracy of Pv up to 0.06 μ M is even higher and widely used for high-precision detection of planar optical components.
application
Widely used for high-precision detection of planar optical components.
characteristic
--Accurately measure the transmitted and reflected wavefronts of large aperture optical components.
--The measurement accuracy and repeatability are comparable to the American Zygo and 4D interferometers.
--Customized development according to customer requirements.
2. The measurement accuracy and repeatability are comparable to the American Zygo and 4D interferometers.
parameter
Trading Area
Global