Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection
Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection
Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection
Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection
Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection
Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection

Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection

$3,339.14 - 6,794.43
Place of Origin
China
Shipping
Air Freight, Ocean Freight, Land Freight

Product Description

Overview

brand
Quasi right
Net weight
variety
colour
model
Number of boxes packed
resolving power
Graduation
structural style
Processing customization
yes
Tolerance level
Applicable objects
working voltage
Imported or not
response time
Indication error
Display method
Nominal diameter
Standard configuration
Distance coefficient
Humidity measurement error
purpose
Standard
UV wavelength
Test scope
ambient temperature
Testing items
Filter specifications
Continuous working hours
Temperature compensation range
Sampling flow range
Power division
Heat meter type
temperature range
-40~600 ℃
Temperature resolution
0.01 ℃
Temperature fluctuations
± 0.01 ℃
heating rate
0.1~100 ℃/min
incubation time
Customizable
cooling rate
0.1~40 ℃/min
DSC range
0~± 600mW
DSC Resolution
0.01uW
DSC sensitivity
0.001mW
Working power supply
AC220V/50Hz or customized
Gas flow rate
0-300mL/min
gas pressure
≤ 5MPa
Display method
24bit color, 7-inch LCD touch screen display
data interface
Standard USB interface

Product Details

Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection
Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection
Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection
Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection
Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection
Semiconductor refrigeration low-temperature DSC differential scanning calorimeter -40 ℃ cold crystallization oxidation induction detection

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Global

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