Overview
| brand | Agilent3070 | material | PCBA |
| New and old degree | nine point five | Product quantity | ten |
| Processing customization | yes | output signal | Measurable |
| producing area | United States | model | Used Agilent3070 |
| Test points | four thousand eight hundred and ninety-nine | Test speed | 20S |
| Display method | LCD | Recycling scope | Across the country |
| Saleable land | nationwide | quantity | On demand customization |
| Product name | Used ICT Agilent | ||
Product Details
The Agilent 3070 circuit board testing system is mainly used for online testing of circuit boards to determine the quality of analog and digital components on PCB boards. It can also perform functional testing, combinational logic testing, analog testing, and bidirectional circuit testing on PCB boards. The HP3070 circuit board testing system uses the UNIX or MS WINDOWS operating system. The hardware mainly includes Testhead, Controller, Support bay, Vacuum box, Fixture, etc.
Main configuration
Agilent3070 Series 3 2M/4M Configuration:
1 pc - PC/Unix Controller
2/4 pcs - ASRU C Cards
2/4 pcs - Control XT/XTp Cards
18/36 pcs - Hybrid Double Density "6Mp/s" Cards
2/4 pcs -6624A Supplies
1 pcs - Printer
Professional second-hand SMT testing equipment
Professional recycling of second-hand ICT online testers from various brands TRI518SII
TRI8100LV, TRI5001E, Agilent3070, Agilent i1000D
Teradyne ICT and TAKAYA test flying needles, various brands of ICT test accessory boards,
Switch board, ATMSMB. DUT. Agilent 3070
XTP control card (E9900-66501)
Asru N (N1807-66550)
Hybrid DD pin card (E4000-66550)
TeradyneTSL124/128 PIN CAR
PIO CAR, System controller
9004-0387 Ultra 124L
9004-0386 Ultra 128L
Provide technical support for factory ICT testing, with a professional team
Quality assurance, reliable technology, and worry free after-sales service. Support idle equipment in factories
Recycling, maintenance, and upgrade processing are welcome for consultation, available 24 hours a day!
Contact number: 13823131881 (same WeChat account)
-Short wire clamp
VECTORLESS TEST (Nano VTEP)
-The latest Nano Step technology
True PARALLEL Testing
-True parallel testing technology
BT Basic DLL Integration
-Execute DLL dynamic database
Power Monitoring Circuit
-Power monitoring
Fixture Power Supply
-Fixture power supply
D test method for large capacitor testing
-DC test mode for testing large capacitors (1000uF to 30mF)
GUI Ease of use
-Graphical interface, easy to operate
-Automatic optimization of testing programs
AutoDebug
-Automatic debugging
IEEE1149.11149.6 Standard Boundary Scan Testing
-Standard 1149.11149.6 boundary scan testing